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  R. Cappelli, D. Maio and D. Maltoni, "Modelling Plastic Distortion in Fingerprint Images", in proceedings Second International Conference on Advances in Pattern Recognition (ICAPR2001), Rio de Janeiro, pp.369-376, March 2001.

  R. Cappelli, D. Maio and D. Maltoni, "Multi-space KL for Pattern Representation and Classification", IEEE Transactions on Pattern Analysis Machine Intelligence, vol.23, no.9, pp.977-996, September 2001.

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